Outlier Detection with Cluster Catch Digraphs

内容摘要

This paper introduces a novel family of outlier detection algorithms based on Cluster Catch Digraphs (CCDs), specifically tailored to address the challenges of high dimensionality and varying cluster shapes, which deteriorate the performance of most traditional outlier detection methods. We propose the Uniformity-Based CCD with Mutual Catch Graph (U-MCCD), the Uniformity- and Neighbor-Based CCD with Mutual Catch Graph (UN-MCCD), and their shape-adaptive variants (SU-MCCD and SUN-MCCD), which are designed to detect outliers in data sets with arbitrary cluster shapes and high dimensions. We present the advantages and shortcomings of these algorithms and provide the motivation or need to define each particular algorithm. Through comprehensive Monte Carlo simulations, we assess their performance and demonstrate the robustness and effectiveness of our algorithms across various settings and contamination levels. We also illustrate the use of our algorithms on various real-life data sets. The U-MCCD algorithm efficiently identifies outliers while maintaining high true negative rates, and the SU-MCCD algorithm shows substantial improvement in handling non-uniform clusters. Additionally, th